Capabilities
Mills and Presses
Piezoelectric Measurements
With a Berlincourt-style meter, we can quickly and easily measure the direct piezoelectric response of macroscopic samples. An Agilent 4294A enables resonant measurements up to 110MHz. Finally, we have priority access to an Asylum MFP-3D scanning probe instrument with the high voltage PFM add-on.
With an aixACCT DBLI, we can collect even higher resolution piezoelectric measurements. The dual-beam laser interferometers (DBLI) allow us to perform piezoelectric characterization on thin films, from 1 inch manually to 8 inches semi-automatically. We can also use the DBLI to determine the d33 coefficient of clamped layers quickly, precisely and with a high degree of reproducibility.
Custom Electronics
With a self-designed transimpedance amplifier and high-speed voltage source, we can measure high power and high speed current response (~200 mA under ~200 V in 200 ns). The instrumentation detail is found here.
We participate fully in the shared resources model on campus and are heavy users of the CCAC and ADAPT labs, the Materials and Manufacturing Lab, and Shared Instrument Facilities. In addition to these, we also maintain the following capabilities that are available for others to use but our primarily accessed by our group.
Furnaces
Impedance Analysis
Ferroelectric Hysteresis
With a Radiant Technologies Precision Multiferroic system integrated with a Trek 609B high voltage amplifier, we can measure ferroelectric hysteresis and a number of other related polarization characteristics across a wide variety of measurement conditions.
We also have an aixACCT system with DBLI for simultaneous measurement of polarization reversal and strain response.
Thin Film Deposition
We have two spin coaters for thin film and/or photoresist deposition, one of which resides inside the CSM class 1000 cleanroom facility. We also have access to extensive sputtering, pulsed laser, and molecular beam epitaxy deposition capabilities both at Mines and via collaborations at NREL and NIST.